August 2013

ICMS participation on the Microscopy Conference 2013 in Regensburg

The MC 2013 in Regensburg from 25th to 30th August, was jointly organized by ten microscopical societies from 11 countries: Switzerland, Austria, Germany, and Croatia, Czech Republic, Slovakia, Hungaria, Italy, Serbia, Slovenia, and for the first time, Turkey.

IMG-20130923-WA0000The ICMS team participated in the event with a presentation of the posters “Characterization of amorphous and porous silicon coatings by (S)TEM and EELS” by R. Schierholz and “Electrostatic properties of insulators in three-dimensions using transmission electron holography tomography” by L.C. Gontard; and the invited talk of Al-NanoFunc coordinator A. Fernandez “Understanding the behavior of a Co-B catalyst for sodium borohydride hydrolysis: An electron microscopy study”.

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