ICMS participation on the Microscopy Conference 2013 in Regensburg
The MC 2013 in Regensburg from 25th to 30th August, was jointly organized by ten microscopical societies from 11 countries: Switzerland, Austria, Germany, and Croatia, Czech Republic, Slovakia, Hungaria, Italy, Serbia, Slovenia, and for the first time, Turkey.
The ICMS team participated in the event with a presentation of the posters “Characterization of amorphous and porous silicon coatings by (S)TEM and EELS” by R. Schierholz and “Electrostatic properties of insulators in three-dimensions using transmission electron holography tomography” by L.C. Gontard; and the invited talk of Al-NanoFunc coordinator A. Fernandez “Understanding the behavior of a Co-B catalyst for sodium borohydride hydrolysis: An electron microscopy study”.
